Beilstein J. Nanotechnol.2012,3, 747–758, doi:10.3762/bjnano.3.84
applicable to all channels of AFM data, and can process images in seconds.
Keywords: adaptive algorithm; artifactcorrection; atomic force microscopy; high-speed atomic force microscope; image processing; Introduction
Atomic force microscopes (AFMs) are a useful tool for investigating nanoscale surfaces
in the image. Panel E shows the raw data of a mixed lipid bilayer on mica. Panel F shows the results of line-by-line second-order polynomial subtraction. Panel G shows 1-D artifactcorrection followed by 2-D second-order polynomial subtraction. Panel H shows the results of 1-D artifactcorrection
detection followed by median correction and a median-difference correction is applied. This corrects for line skips in the source image. Following the 1-D artifactcorrection, a global correction is applied. The primary function is to remove overall sample tilt and some second-order distortions. The image
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Figure 1:
This figure shows the cumulative effects of typical distortions on model AFM data. Panels A though ...